Test programs are generated based on customer specifications and test pattern generator outputs. Scan test (JTAG) and IDDQ testing are also supported. Specifications and testability issues are discussed between customer and test engineers before project start. And, prior to volume production the test engineer provides characterization data and information about the manufacturability (cpk indexes) of the new product.

The test department specializes in leakage current measurements in the range of only a few femtoamps, the accurate test parallel test of mixed signal devices to reduce testing costs, timing jitter measurements in the picosecond range and provides controlled impedance, low inductance, low capacitance testboards and test fixtures for the test of RF (radio frequency) circuits.

Test hardware consists of a probe card, load boards and interconnect devices. Circuits which have to be tested at radio frequencies require special hardware components which may increase costs dramatically - ams will help you to investigate.